Measurement of Vortex Beam Phase by Electron Holography
نویسندگان
چکیده
منابع مشابه
Improvement of the accuracy of phase observation by modification of phase-shifting electron holography.
We found that the accuracy of the phase observation in phase-shifting electron holography is strongly restricted by time variations of mean intensity and contrast of the holograms. A modified method was developed for correcting these variations. Experimental results demonstrated that the modification enabled us to acquire a large number of holograms, and as a result, the accuracy of the phase o...
متن کاملBenchmarking of Monte Carlo model of 6 Mv photon beam produced by Siemens Oncor® linear accelerator: determination of initial electron beam parameters in comparison with measurement
Introduction: The aim of this study was to investigate the initial electron beam parameters for Monte Carlo model of 6MV photon beam produced by Siemens Oncor® linear accelerator. Materials and Methods: In this study, the EGSnrc Monte Carlo user codes BEAMnrc and DOSXYZnrc were used. The beamnrc code were used for modelling of a 6 MV photon beam produced by...
متن کاملMeasurement of Small Electron Beam Spots
Measurements of transverse beam size are tremendously important to the performance of ee linear colliders. In this paper we review the traditional technologies used to make such measurements, such as pro le monitors and wire scanners, and the limitations on same. We then introduce a new tool for electron beam size measurement: Compton-scattered laser light, which may be used as an unbreakable \...
متن کاملObservation of magnetic multilayers by electron holography.
Magnetic structures of Co/Cu multilayers in cross section are observed by two kinds of electron holography: a Fourier method and a phase-shifting method, which is introduced briefly. The Fourier method can easily reconstruct wave functions and is applied to many specimens, whereas the phase-shifting method requires longer time for processing, but has a higher spatial resolution that permits us ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2017
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927617003622